We are offering competitive Scanning Probe Microscopy services
Our proprietary, in-house-developed allow for 3D & conductive measurements of sub-nanometer surface features within minutes, faster than conventional AFM techniques & suitable for a wide range of
Our Capability
- Field of View: 8×8µm → 0.5×0.5µm @ 1Mpx, configurable
- Resolution: horizontal <1nm, vertical <0.1nm
- Imaging Speed: 4sec to 16min @ up to 0.2Mpx/s
- Automated instrument & stage operation
- Comprehensive data analysis solutions
- Processing of large data sets
- Sample confidentiality
- In-person & remote scanning
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