All Electronics Industry Feature: Peter Jenkins

Great to see our CEO, Peter Jenkins, featured in the latest edition of All Electronics Industry, discussing closing the measurement gap, one of the biggest challenges facing advanced semiconductor manufacturing.

As semiconductor architectures become increasingly complex and three-dimensional, traditional metrology techniques are struggling to provide the speed, accuracy and 3D insight manufacturers need for effective process control.

Peter explores why this gap is becoming increasingly important as the industry moves towards advanced logic, memory and packaging, and how high-speed 3D metrology can give manufacturers a much clearer picture of what is happening at critical stages of production.

At Infinitesima, our Rapid Probe Microscope (RPM™) technology combines true 3D measurement with the speed required for high-volume semiconductor manufacturing, helping manufacturers improve process control, maintain yield and support the next generation of advanced devices.

A great piece on an increasingly important challenge for the semiconductor industry.

Read Peter’s article, “Closing the measurement gap in semiconductor manufacturing,” in the July–August edition of All Electronics

July–August edition of All Electronics